In addition, this semiconductor is very stable, as mentioned before, and can be easily evaporated. Finally, Ag was chosen as the conductive layer because of its suitable optical properties in the visible region. Hence, TiO2/Ag/SiO2 (TAS) transparent films were fabricated,

and their possible application in TCOs was examined. Methods Fabrication of TiO2/Ag/SiO2 transparent films LEE011 concentration deposition techniques TAS multilayers were fabricated by electron-beam (E-beam) evaporation with ion-assisted deposition ion-beam-assisted deposition (IAD) under a base pressure of 5 × 10−7 Torr. The substrates were kept at room temperature before starting Niraparib deposition. The working pressure for the deposition of the first layer (TiO2) was maintained at 4 × 10−4 Torr with O2, whereas the deposition of the third layer (TiO2) was maintained at 6 × 10−6 Torr (without O2) in the 0- to 10-nm thickness range and at 4 × 10−4 Torr (O2) in the 10- to 70-nm thickness range. The working pressure for the deposition of the second layer (Ag) was maintained at 6 × 10−6 Torr (without O2). The deposition Saracatinib solubility dmso rate of TiO2 was 0.3 nm/s and that of Ag was 0.5 nm/s. The ZnO film was bombarded by oxygen ions with ion beam energies of 400 to 500 W, whereas the Ag film was bombarded by argon

ions with ion beam energies of 400 to 500 W. The film thickness was determined using an optical thickness monitoring system, and the evaporation rate was deduced from the measurements of a quartz oscillator placed in the deposition chamber. The

thicknesses of the glass-attached TiO2 layer, Ag layer, and protective layer SiO2 were determined using the Macleod simulation software. Optical properties, electrical properties, and microstructure analysis Optical transmittance measurements were performed on the TAS multilayers using Non-specific serine/threonine protein kinase an ultraviolet–visible-near-infrared (UV–vis-NIR) dual-beam spectrometer in 400 to 700 nm wavelength range. Optical polarization was applied to the single films by ellipsometric measurements to increase the refraction index. The crystal orientation of the deposited films was examined by x-ray diffraction (XRD) with Cu Kα radiation. A transmission electron microscope (JEOL 2000 EX H; JEOL Ltd., Akishima, Tokyo, Japan), operated at 200 kV, and a field-emission gun transmission electron microscope, operated at 300 kV, were used for cross-sectional microstructure examination. Energy-dispersive spectra (EDS) and electron diffraction patterns obtained using this equipment enabled detailed sample characterization. The sheet resistance of the samples was measured by a Hall system. X-ray photoelectron spectroscopy (XPS) measurements were carried out using a Thermo Scientific K-Alpha spectrometer (Thermo Fisher Scientific, Hudson, NH, USA).